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作 者:马慧侠[1]
机构地区:[1]中国铝业股份有限公司郑州研究院,河南郑州450041
出 处:《轻金属》2013年第2期13-17,共5页Light Metals
摘 要:介绍了使用X射线荧光光谱法测定氟化铝的主次量成分。采用熔融玻璃片法制样,此方法简单,迅速,成本低。选用GSB 04-2194-2008系列标准样品,采用仪器软件SuperQ中提供的飞利浦模式的经验系数(Classic)和基本参数法校正元素间的谱线重叠干扰和基体效应,使用Magix(PW2403)X射线荧光光谱仪对样品中的F、Na、Al、SiO2、Fe2O3、P2O5和SO42-共7个成分进行测定,各组分的RSD均小于3.5%,测量结果与标准值的误差在化学分析允许差范围内。A method has been developed for the determination of F, Na, Al, SiO2, Fe2O3 , P2O5 and SO4^2- in aluminum fluoride by an X - ray fluorescence spectrometric Magix ( PW2403 ) with fused glass disk method and GSB 04 - 2194 - 2008 serial standard samples. The inter element and matrix effects were corrected by using empirical alpha (ct) coefficient program (classic) provided by the Super Q and basic parameters. The RSD's obtained were less than 3.5%. The discrepancies between the results obtained by the present method and the certified values were within the allowable range of chemical analysis.
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