论有限回溯测试模式产生方法  

On Finite Backtracking Test Pattern Generation Method

作　　者：曾芷德[1] 曹贺锋[1] 

机构地区：[1]国防科技大学计算机学院,长沙410073

出　　处：《电子学报》2000年第11期102-105,共4页Acta Electronica Sinica

基　　金：国家自然科学基金! (No .697730 35)

摘　　要：本文首先剖析了有限回溯测试模式产生 (FBTPG)方法的实质 ,然后在深入分析三种ATPG系统的C B曲线的实验数据的基础上 ,提出故障模拟对测试生成的综合调节效应 ,为FBTPG方法的有效性提供了理论依据 .最后以ISCAS 85和ISCAS 89电路为基础 ,给出了FBTPG与随机测试生成、确定性测试生成和商用ATPG系统FlexTest的实验比较结果 。Based on the penetrating analysis of the characteristics in finite backtracking test pattern generation (FBTPG) and the three experimental C B curves from three different ATPG systems,a new global adjusting effect about the influence of fault simulation on test generation is proposed.This theory is the theoretic base to prove the efficiency of FBTPG.Finally,ISCAS 85 circuits are used as a benchmark to run FBTPG,random test generator,deterministic test generator,and a commercial ATPG system(FlexTest) respectively and compare the results.The results prove that FBTPG method is more efficient in large scale sequential circuits.

关 键 词：有限回溯测试模式产生 确定性测试生成 故障模拟 

分 类 号：TP301.6[自动化与计算机技术—计算机系统结构]