低阻Nb_3 Sn CICC超导接头研制与性能测试  

Development and testing of the low resistance Nb3Sn CICC superconducting joint

作　　者：史全意[1] 陈治友[1] 谭运飞[1] 朱加伍[1] 黄鹏程[1] 陈文革[1] 

机构地区：[1]中国科学院强磁场科学中心,合肥230031

出　　处：《低温与超导》2013年第5期18-21,68,共5页Cryogenics and Superconductivity

摘　　要：已经研制出两种结构的低电阻值Nb3Sn CICC超导接头,同时利用超导变压器原理并采用高精度的Keithley 2002的数据采集系统对两种超导接头进行了性能测试,并采用感应法即衰减常数法对两种CICC超导接头性能测试数据进行分析,结果表明:两种超导接头满足其设计要求。Two type of Nb3Sn CICC superconducting joints were developed at the High Magnet Field Laboratory of the Chi- nese Academy of Sciences （CHMFL）. In addition, two type of superconducting joints were tested using the superconducting transformer and the data acquisition system （ Keithly 2002） with high precision. Based on the analysis of the test results by the induction method, namely the attenuation constant method, the design of two type Nb3Sn CICC superconducting joints satisfied the requirements.

关 键 词：NB3SN CICC 超导接头 性能测试 

分 类 号：TL631.24[核科学技术—核技术及应用]