检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:范勇[1,2] 张洪亮[1] 杨瑞宵[1] 陈昊[1]
机构地区:[1]哈尔滨理工大学材料科学与工程学院,黑龙江哈尔滨150040 [2]材料研究与应用黑龙江省高校重点实验室,黑龙江哈尔滨150040
出 处:《哈尔滨理工大学学报》2013年第2期21-24,29,共5页Journal of Harbin University of Science and Technology
基 金:国家自然科学基金(50373008)
摘 要:以微乳化-热液法制备硅/铝氧化物纳米分散液,并制备了一系列掺杂层与中间层厚度比不同的纳米掺杂三层复合聚酰亚胺(PI)薄膜.在相同环境条件下进行了薄膜的透射电镜(TEM)测试和电导电流测试.TEM测试结果可以直接观察到纳米粒子在有机基体中分散均匀,且可得到三层复合薄膜的复合结构,掺杂层和中间层的尺寸比例符合实验要求.复合薄膜的电导电流在同一电场强度下随着掺杂层厚度比例的增加逐渐增大,而电老化阈值随着掺杂层厚度比例增大向低场强方向移动.Micro emulsion-hydrothermal method was used in preparing a series of three-layer PI composite films, which have different thickness ratio of doped PI layer and pure PI layer. Their mierostructure and conduction current were tested by TEM and electrical current experiment devices under the same conditions. Composite films could clearly show from TEM test, the dimension scale of doped PI layer and pure PI layer was fit with experimental requirements, and nano-particles dispersed well in organic matrix. Under the same electric field strength, the conduction current of composite films were increased with doped layer thickness increasing. Electrical degradation threshold showed a decreasing trend when doped layer thickness increased.
分 类 号:TM215.3[一般工业技术—材料科学与工程] TQ323.7[电气工程—电工理论与新技术]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.222