受纳米结构损伤限制的光纤拉曼探头SERS探测灵敏度  

SERS detection sensitivity of fiber Raman probe limited by nanostructure damage threshold

作　　者：廖艳林[1,2] 张腊梅[1] 刘晔[1] 曹杰[1] 毛庆和[1,3] 

机构地区：[1]中国科学院安徽光学精密机械研究所,安徽省光子器件与材料重点实验室,安徽合肥230031 [2]安徽大学物理与材料科学学院,安徽合肥230039 [3]中国科学技术大学,安徽合肥230022

出　　处：《量子电子学报》2013年第3期348-353,共6页Chinese Journal of Quantum Electronics

基　　金：国家973计划(2007CB936603);国家自然科学基金(11104282)资助项目

摘　　要：利用光线追迹法,研究了典型光纤拉曼探头在纳米结构损伤限制下收集到的表面增强拉曼散射(SERS)功率与样品位置之间的关系。结果表明,对于不同焦距构成的同轴等光程光纤拉曼探头,在给定的纳米结构损伤阈值激发光功率密度下,样品偏离焦平面反而会使探头收集到的SERS功率增加,相比于样品远离探头方向偏离焦平面,靠近探头方向偏离焦平面时收集到的SERS功率更高。此外,收集光纤芯径越大,探头所收集的SERS功率越大。The relationship between surface-enhanced Raman scattering （SERS） power collected by the fiber Raman probe and sample position was investigated theoretically under the sample damage threshold limit by using ray tracing method. The results show that, in a given damage excitation power density threshold, the SERS power collected by the probe with different focal-length lens increases when the sample deviates from the focal plane. Furthermore, compared with the situation that the sample is away from the probe and deviate from the focal plane, SERS power collected by the probe is higher at the situation that the sample is close to the probe and deviates from the focal plane. In addition, the lager the collection fiber core diameter is, the greater the power collected by the probe will be.

关 键 词：光谱学 表面增强拉曼散射 光纤拉曼探头 损伤 局域表面等离子振荡 

分 类 号：TN248.1[电子电信—物理电子学]