聚酰亚胺薄膜绝缘材料耐电晕机理研究  

Study on the corona-resistance mechanism of the polyimide films

作　　者：陈昊[1] 范勇[1,2] 杨瑞宵[1] 王春平[1] 马鑫[3] 

机构地区：[1]哈尔滨理工大学材料科学与工程学院,黑龙江哈尔滨150040 [2]哈尔滨理工大学材料研究与应用黑龙江省高校重点实验室,黑龙江哈尔滨150040 [3]哈尔滨理工大学电气与电子工程学院,黑龙江哈尔滨150080

出　　处：《电机与控制学报》2013年第5期28-31,共4页Electric Machines and Control

基　　金：国家自然科学基金(50373008)

摘　　要：为了探讨聚酰亚胺薄膜绝缘材料耐电晕机理,对自制纳米杂化聚酰亚胺(PI)薄膜进行不同时间的电晕预处理,并对电晕预处理后的试样分别进行电晕老化与热激电流(TSDC)测试,结果发现在适当的电晕预处理条件下,纳米杂化PI薄膜的耐电晕寿命会得到提高,且薄膜耐电晕寿命、热激电流活化能都与薄膜电晕预处理时间存在一定关系,二者变化趋势大致相同。分析表明纳米杂化PI薄膜的耐电晕寿命与其中受陷载流子的状态有关,当材料中均匀分布能级较深的稳定的载流子陷阱时,材料表现出较好的耐电晕性能。In order to study the corona-resistance mechanism of the polyimide films, the home-made nano-hybird polyimide films were treated with different corona pre-treatment time. The corona-resistance life and thermally stimulated depolarization current （TSDC） of the treated samples were tested. The results show that the corona-resistance life of the polyimide films is extended under the suitable corona pre-treatment conditions; the corona-resistance life of the films has relations with the corona pretreatment time, and it is related with the state of the trapped carriers in the films. When level even-distributed deep stable carriers traps in material, material shows good corona resistance performance.

关 键 词：纳米掺杂 聚酰亚胺 载流子陷阱 耐电晕 

分 类 号：TM215[一般工业技术—材料科学与工程]