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作 者:吴星琳[1] 邱亚峰[1] 钱芸生[2] 刘照路 程宏昌
机构地区:[1]南京理工大学机械工程学院,江苏南京210094 [2]南京理工大学电子工程与光电技术学院,江苏南京210094 [3]微光夜视技术重点实验室,陕西西安710065
出 处:《应用光学》2013年第3期494-497,共4页Journal of Applied Optics
基 金:微光夜视技术重点实验室基金(J20110403)
摘 要:日盲型紫外像增强器在空间光学探测、环境监测、战略国防等方面上具有非常广阔的应用前景,参照微光像增强器信噪比测试原理,设计了紫外像增强器信噪比测试系统,并给出其测试条件,利用研制的信噪比测试仪研究了微通道板两端电压对日盲型紫外像增强器信噪比的影响,测量了其关系曲线。结果表明,在小于850V区域内,紫外像增强器的输出信噪比随着MCP两端电压的增大而增大;当超过850V时,MCP两端电压增大,紫外像增强器的输出信噪比基本维持不变。Ultraviolet image intensifier has a very broad application prospects in many fields, such as space optical detection, environmental monitoring, strategic defense, and so on. Sig nal-to noise ratio measurement system of ultraviolet image intensifier was designed by refer- ence to the test principle of signal-to-noise ratio for UV image intensifier, and its test condi- tions were provided. The relationship between voltage of MCP and signal-to-noise ratio of UV image intensifier was deeply studied, and its curve is measured by using the development of its own signal-to-noise ratio tester for UV image intensifier. The result shows that in the region of less than 850 V, the output of the signal-to-noise ratio of the ultraviolet image intensifier is in- creased with the increase of voltage; when the voltage is more than 850 V, the output of the signal-to-noise ratio of the ultraviolet image intensifier is essentially unchanged.
分 类 号:TN144[电子电信—物理电子学]
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