Thin Dielectric Sheets Approximations for EM Scattering from Layered Dielectric Structures  

作　　者：HE Shiquan NIE Zaiping HU Jun 

机构地区：[1]School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China

出　　处：《Chinese Journal of Electronics》2013年第2期419-425,共7页电子学报（英文版）

基　　金：This work is supported in part by the International Joint Research Project of China （lllProject） （No.B07046）, and the National Natural Science Foundation of China （No.60931004）.

摘　　要：In this paper, a multi-layer TDS （Thin di- electric sheets） model is proposed to simplify the Volume integral equation （VIE） based on the TDS approximations when we solve the Electromagnetic （EM） scattering from layered dielectric structures. The tangential components of polarization current in each layer are approximated to linear variation along the transverse direction while con- stant in the normal direction. Similarly, the normal com- ponents are approximated to vary linearly in the normal direction and keep constant within a small patch in the tangential direction. Based on these approximations, and the divergence free and normal continuity conditions of D fiux＇ a set of recursive formulations are derived out to re- duce the number of independent basis functions＇ which are used to construct the polarization current. When＇ we can further approximate the volume integrals in VIE to some surface integrals for far filed evaluation. The above TDS approximations can alleviate the difficulty of geometry dis- cretization＇ reduce the number of unknowns＇ and shorten the time consumption of numerical calculation. The com- putational complexity of numerical simulation is reduced significantly.

关 键 词：Dielectric scattering Volume integral equation Multi-layer TDS （Thin dielectric sheets） approx- imations. 

分 类 号：O347[理学—固体力学] TN011[理学—力学]