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作 者:郝东亮[1,2] 鱼卫星[1] 王泰升[1] 卢振武[1] 孙强[1]
机构地区:[1]中国科学院长春光学精密机械与物理研究所,吉林长春130033 [2]中国科学院大学,北京100049
出 处:《红外技术》2013年第5期265-269,共5页Infrared Technology
摘 要:微扫描技术能提高红外系统的分辨率,这使得对微扫描器的研究意义非凡。针对非制冷红外焦平面探测器,在已知微扫描器的叶片形状参数以及微扫描器与焦平面阵列的相对位置的前提下,结合具体个例,计算了焦平面阵列上各个像元的曝光顺序,为后续读出电路的读出顺序的选择和进一步的数字图像处理提供了依据。Microscanning is a promising technology being able to improve the reso'lution of the infrared imaging system, which has been extensively studied and a lot of efforts have been made to develop micro-scanners. In this paper, a method of calculating the exposure sequence of the infrared focal plane array is proposed. The method is derived based on a practical microscanner reported earlier from which the geometrical parameters of the microscanner and the relative position between the microscanner and the focal plane array were already known. By employing our method, it is convenient to calculate the exposure sequence of focal plane array and will be helpful for reading out signal by the read-out circuit.
分 类 号:TN215[电子电信—物理电子学]
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