电子清刷对双MCP像增强器闪烁噪声的影响  

Influence of Electron Scrubbing on Flicker Noise of Double-MCP Image Intensifiers

作　　者：冯刘[1,2] 刘晖[1,2] 张连东[1,2] 高翔[1,2] 苗壮[1,2] 程宏昌[1,2] 贺英萍[1,2] 史鹏飞[1,2] 

机构地区：[1]微光夜视技术重点实验室,陕西西安710065 [2]北方夜视科技集团有限公司,云南昆明650223

出　　处：《红外技术》2013年第5期295-299,共5页Infrared Technology

摘　　要：由于微通道板除气不彻底,导致双微通道板像增强器在工作时视场上出现闪烁噪声,因而无法正常工作。为了消除闪烁噪声并使微通道板增益进入一个稳定值区间,采用不同的电子清刷控制方法,对两块微通道板进行彻底除气,结果表明:增大萃取电荷量的方法在减少闪烁噪声的同时也会降低像增强器的增益,而增加台外预先电子清刷阶段并且使第二块微通道板的预先萃取电荷量大于第一块微通道板,可以完全消除闪烁噪声。选择合适的预先萃取电荷量,可以保证像增强器的增益达到105以上,制作出合格的双微通道板像增强器。Inadequate degassing generated heavy flicker noise on field of view, which enabled double-MCP image intensifiers not to work normally. In order to eliminate flicker noise and achieve stable MCP gains, different electron scrubbing schemes were used to degas completely two MCPs. The results indicated that if extracted charge amount was increased, flicker noise was degenerated while the gain of image intensifier was decreased, but if combined pre-electron-scrubbing with more pre-extracted charge amount of second MCP than of first MCP, flicker noise was completely eliminated. In result, if appropriate pre-extracted charge amount was chosen, the gain of image intensifier could be more than 105 and double-MCP image intensifiers up to standard could be produced.

关 键 词：电子清刷 双微通道板 像增强器 闪烁噪声 萃取电荷量 

分 类 号：TN223[电子电信—物理电子学]