窄缝条件下影响微波单缝衍射图样的主要因素  

Main factors affecting the patterns of narrow-slit microwave diffraction

作　　者：余伟超[1] 杜艾[1] 张志华[1] 方恺[1] 

机构地区：[1]同济大学理学部物理系,上海200092

出　　处：《物理实验》2013年第2期37-40,45,共5页Physics Experimentation

摘　　要：通过测量30mm窄缝宽条件下微波单缝衍射图样,发现其主极大以及其它多处场强分布与理论图像不符.分别从单缝板边缘绕射、微波分光计底座反射和发射喇叭口干涉等方面定性探讨出现以上现象的原因,并由此提出一些改进方案.By measuring the patterns of the microwave diffracted by a 30mm slit,it was found that the principal maximum and the other intensity distribution did not agree with the theoretical prediction.Thus the factors including edge diffraction,plate reflection,transmitting horn interference,etc.,were considered to explain the phenomenon qualitatively,some improvements were proposed accordingly.

关 键 词：微波 单缝衍射 边缘绕射 干涉 

分 类 号：O436.1[机械工程—光学工程]