电荷耦合器件饱和效应对PIE成像质量的影响  

Influence of Charge Coupled Device Saturation on PIE Imaging

作　　者：王宝升[1] 高淑梅[1] 王继成[1] 朱健强[2] 刘诚[1] 

机构地区：[1]江南大学理学院光信息科学与技术系,江苏无锡214122 [2]中国科学院上海光学精密机械研究所联合实验室,上海201800

出　　处：《光学学报》2013年第6期65-70,共6页Acta Optica Sinica

基　　金：江苏省自然科学基金(BK2012548)资助课题

摘　　要：在研究电荷耦合器件(CCD)饱和效应对PIE成像质量影响的基础上,提出了一种改进的重建算法。该方法可以从发生部分饱和的数据重建出准确的再现像。和现有的方法相比,此方法可以在保证分辨率不受影响的条件下,大幅度缩短数据采集时间,因此可显著降低对实验装置和样品稳定性的要求,对PIE方法的推广应用有重要的实际意义。Based on the analysis of the influence of the charge coupled device （CCD） saturation on the image quality of ptychographical iterative engine （PIE）, an improved reconstruction algorithm is proposed to get accurate reconstruction from partially saturated data. Compared with the common algorithm, the suggested method can remarkably reduce the data acquisition time without degrading the spatial resolution of the reconstruction, so the requirement on the stability of the experimental setup and the specimen is obviously reduced, and this method is quite meaningful for a wide range of applications of PIE.

关 键 词：成像系统 相干衍射成像 相位恢复 显微成像 PIE 

分 类 号：TP212.1[自动化与计算机技术—检测技术与自动化装置]