基于单光弹调制器的米勒矩阵测量误差分析  

Measurement Error Analysis for Mueller Matrix Based on a Single Photo-Elastic Modulator

作　　者：曹绍谦[1,2] 步扬[1] 王向朝[1] 李思坤[1] 汤飞龙[1,2] 李中梁[1] 

机构地区：[1]中国科学院上海光学精密机械研究所信息光学与光电技术实验室,上海201800 [2]中国科学院大学,北京100049

出　　处：《光学学报》2013年第6期157-163,共7页Acta Optica Sinica

基　　金：国家自然科学基金(60938003;61205102;61275207);科技部国际科技合作项目(2011DFR10010)资助课题

摘　　要：针对已有单光弹调制器米勒矩阵测量技术缺乏定量误差分析的不足,提出了单光弹调制器米勒矩阵测量误差方程,给出了相对误差分析方法,并结合矩阵条件数得到了降低米勒矩阵各元素最大相对误差的两组1/4波片方位角优化组合。实验结果表明,该两组1/4波片方位角优化组合,测量得到的待测1/4波片米勒矩阵各元素的最大相对误差分别为0.12%和0.20%,相比传统1/4波片方位角优化组合{-90°,-45°,30°,60°}条件下得到的各元素最大相对误差为0.83%,分别降低了85.54%和75.90%。A measurement error equation and a relative error analysis method for the Mueller matrix measurement technique based on a single photo-elastic modulator are proposed. Considering the relative error and the condition number, two optimum angle sets for the quarter-wave plate are obtained, which diminish the maximum relative error of each element of the Mueller matrix. The experimental results show that the maximum relative errors of each element of the Mueller matrix of the measured quarter-wave plate are 0.12% and 0.20% respectively by using the two optimum angle sets above. Compared to the maximum relative error of 0.83% of the traditional optimum angle sets {-90°,-45°,30°,60°} for the quarter-wave plate, the maximum relative errors of each element of the Mueller matrix of the measured quarter-wave plate are decreased by 85.54% and 75.90% respectively by using the two optimum angle sets above.

关 键 词：测量 偏振 米勒矩阵 单光弹调制器 误差方程 条件数 

分 类 号：O436.3[机械工程—光学工程]