Microstructural characterization of polycrystalline materials by synchrotron X-rays  

作　　者：Leyu n WANG Meimei LI Jonathan ALMER Thomas BIELER Rozaliya BARABASH 

机构地区：[1]Nuclear Engineering Division, Argonne National Laboratory, Lemont, IL 60439, USA [2]X-ray Science Division, Argonne National Laboratory, Lemont, IL 60439, USA [3]Department of Chemical Engineering & Materials Science, Michigan State University, East Lansing, MI 48824, USA [4]Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

出　　处：《Frontiers of Materials Science》2013年第2期156-169,共14页材料学前沿（英文版）

摘　　要：Third generation synchrotron X-rays provide an unprecedented opportu- nity for microstructural characterization of many engineering materials as well as natural materials. This article demonstrates the usage of three techniques for the study of structural materials： differential-aperture X-ray microscopy （DAXM）, three-dimensional X- ray diffraction （3DXRD）, and simultaneous wide angle/small angle X-ray scattering （WAXS/SAXS）. DAXM is able to measure the 3D grain structure in polycrystalline materials with high spatial and angular resolution. In a deformed material, streaked diffraction peaks can be used to analyze local dislocation content in individual grains. Compared to DAXM, 3DXRD is able to map grains in bulk materials more quickly at the expense of spatial resolution. It is very useful for studying evolving microstructures when the materials are under deformation. WAXS/SAXS is suitable for studying materials with inhomogeneous structure, such as precipitate strengthened alloys. Structural informa- tion revealed by WAXS and SAXS can be combined for a deeper insight into material behavior. Future development and applications of these three techniques will also be discussed.Third generation synchrotron X-rays provide an unprecedented opportu- nity for microstructural characterization of many engineering materials as well as natural materials. This article demonstrates the usage of three techniques for the study of structural materials： differential-aperture X-ray microscopy （DAXM）, three-dimensional X- ray diffraction （3DXRD）, and simultaneous wide angle/small angle X-ray scattering （WAXS/SAXS）. DAXM is able to measure the 3D grain structure in polycrystalline materials with high spatial and angular resolution. In a deformed material, streaked diffraction peaks can be used to analyze local dislocation content in individual grains. Compared to DAXM, 3DXRD is able to map grains in bulk materials more quickly at the expense of spatial resolution. It is very useful for studying evolving microstructures when the materials are under deformation. WAXS/SAXS is suitable for studying materials with inhomogeneous structure, such as precipitate strengthened alloys. Structural informa- tion revealed by WAXS and SAXS can be combined for a deeper insight into material behavior. Future development and applications of these three techniques will also be discussed.

关 键 词：differential-aperture X-ray microscopy （DAXM） three-dimensional X-raydiffraction （3DXRD） wide angle/small angle X-ray scattering （WAXS/SAXS） 

分 类 号：TB383[一般工业技术—材料科学与工程] TH742.63[机械工程—光学工程]