X射线荧光光谱分析技术  

Analytical Technique by X-ray Fluorescence Spectrometry

作　　者：曲月华[1] 王一凌[1] 

机构地区：[1]鞍钢股份有限公司技术中心,辽宁鞍山114009

出　　处：《鞍钢技术》2013年第3期7-10,31,共5页Angang Technology

摘　　要：介绍了X射线荧光光谱分析试样制备的方法与技术、参照物的选择、校准样品的制备、定量分析的校准方法、基体干扰的校正及如何判定结果的正确性。对X射线荧光光谱分析涉及的技术手段及特点进行了分析比较,有助于增进对X射线荧光光谱分析技术的全面了解和应用。Some methods or techniques for preparing samples to be analyzed by X-ray fluorescence spectrometry are introduced,including the choice of a reference sample,preparation of a calibration sample,the calibration method for quantitative analysis,calibration of matrix interference and the method for determining the correctness of obtained results.Technical means and characteristics relating to X-ray fluorescence spectrometry are analyzed based on comparison and this can be helpful to understand and apply the analytical technique by X-ray fluorescence spectrometry.

关 键 词：X射线荧光 试样制备 校准方法 

分 类 号：O657[理学—分析化学]