电子产品EMC测试失效问题探析及对策  

Exploration and Solutions of EMC Testing Failure of Electronic Products

作　　者：黄曼雪[1] 

机构地区：[1]深圳市标准技术研究院

出　　处：《安全与电磁兼容》2013年第3期92-95,共4页Safety & EMC

摘　　要：针对电子产品EMC初始设计失效的原因,从EMC法规、电磁兼容环境、产品的EMC设计三个主要方面以及产品EMC设计的流程规范、符合性设计、预符合性测试三个子维度阐述关键考量点,并给出了相应的解决对策与建议,期望能帮助电子产品设计人员和制造商解决产品开发过程中遇到的实际问题,提高产品设计成功率,加快产品上市时间。According to the possible causes of failure on initial EMC design for electronic produels, the key eonsideralions on the specifications of design procedure and the designs for compliance and pre-compliance are analyzed through revealing EMC regulations from different perspectives, discussing the meaning of EMC environment, and considering EMC design. The solutions and recommendations for the failure are proposed to resolve the realistic problems, to improve the success rale of product design, and to shorten the time to market of products.

关 键 词：电子产品 电磁兼容 初始失效 

分 类 号：TN03[电子电信—物理电子学]