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机构地区:[1]Department of Information Science and Electronics Engineering,Zhejiang University [2]Hangzhou Applied Acoustics Research Institute
出 处:《Journal of Semiconductors》2013年第6期81-84,共4页半导体学报(英文版)
基 金:supported by the Natural Basic Research Program of China(No.2013CB632105);the National Natural Science Foundation of China(No.61177055)
摘 要:The photocurrent effect in pin silicon waveguides at 1550 nm wavelength is experimentally investigated. The photocurrent is mainly attributed to surface-state absorption,defect-state absorption and/or two-photon absorption.Experimental results show that the photocurrent is enhanced by the avalanche effect.A pin silicon waveguide with an intrinsic region width of 3.4μm and a length of 2000μm achieves a responsivity of 4.6 mA/W and an avalanche multiplication factor of about five.The photocurrent effect in pin silicon waveguides at 1550 nm wavelength is experimentally investigated. The photocurrent is mainly attributed to surface-state absorption,defect-state absorption and/or two-photon absorption.Experimental results show that the photocurrent is enhanced by the avalanche effect.A pin silicon waveguide with an intrinsic region width of 3.4μm and a length of 2000μm achieves a responsivity of 4.6 mA/W and an avalanche multiplication factor of about five.
关 键 词:PHOTODETECTOR silicon waveguide PHOTOCURRENT avalanche effect
分 类 号:TN312.7[电子电信—物理电子学]
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