基于并行频率测量的TCXO高效测试技术  

A High-effective TCXO Test Method based on Parallel Frequency Measurement

作　　者：陈亮[1] 黄仰博[1] 田丰[1] 吴舜晓[1] 欧钢[1] 

机构地区：[1]国防科技大学电子科学与工程学院,湖南长沙410073

出　　处：《宇航计测技术》2013年第3期34-38,共5页Journal of Astronautic Metrology and Measurement

摘　　要：当前的温补晶振测试系统受频率测量容量制约,测试效率不高,本文提出了一种基于直接测频法的并行频率测量方法,并采用该方法实现了并行TCXO测试系统。该测试系统已经可以对至少100颗TCXO同时进行测试,且测试容量还可以进一步增加。该测试系统的频率相对测量误差低于±4×10-9,完全符合目前TCXO的设计和生产精度要求。应用该并行测试系统可显著提高TCXO测试与生产的效率。The present TCXO test systems are of low test efficiency because of limited frequency measurement capacity. A parallel frequency measurement method based on directly frequency measure- ment is proposed in this paper and a parallel TCXO test system using this method was developed. At least 100 TCXOs can be measured simultaneously in the proposed test system, and its test capacity can be ex- panded further. Its frequency measurement error is less than ±4×10^-9 fully meeting the accuracy require- ment of the design and production of state-of-the-art TCXOs. The test and production efficiency of TCXOs can be raised using this test system.

关 键 词：温补晶振 测试系统 +并行频率计 

分 类 号：TN75[电子电信—电路与系统]