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作 者:吕元杰 冯志红 顾国栋 敦少博 尹甲运 韩婷婷 盛百城 蔡树军 刘波 林兆军
机构地区:[1]Science and Technology on Application Specific Integrated Circuit (ASIC) Laboratory,Hebei Semiconductor Research Institute [2]School of Physics,Shandong University
出 处:《Chinese Physics B》2013年第7期426-429,共4页中国物理B(英文版)
基 金:the National Natural Science Foundation of China(Grant Nos.60890192,60876009,and 11174182);the Foundation of Key Laboratory,China
摘 要:An Ni/Au Schottky contact on an AlGaN/GaN heterostructure has been prepared. By using the peak-conductance model, the threshold voltage and the series resistance of the AlGaN/GaN diode are simultaneously extracted from the conductance-voltage (G-V) curve and found to be in good agreement with the ones obtained by using the capacitance-voltage (C-V) curve integration and the plot of dV/d(ln I) versus current I. Thus, a method of directly and simultaneously extracting both the threshold voltage and the series resistance from the conductance-voltage curve for the AlGaN/GaN Schottky diode is developed.An Ni/Au Schottky contact on an AlGaN/GaN heterostructure has been prepared. By using the peak-conductance model, the threshold voltage and the series resistance of the AlGaN/GaN diode are simultaneously extracted from the conductance-voltage (G-V) curve and found to be in good agreement with the ones obtained by using the capacitance-voltage (C-V) curve integration and the plot of dV/d(ln I) versus current I. Thus, a method of directly and simultaneously extracting both the threshold voltage and the series resistance from the conductance-voltage curve for the AlGaN/GaN Schottky diode is developed.
关 键 词:AlGaN/GaN heterostructure Schottky diode threshold voltage series resistance
分 类 号:TN311.7[电子电信—物理电子学] TN304.23
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