红外探测器杜瓦非概率可靠性设计方法  

Non-probabilistic reliability design for IR detector Dewar

作　　者：王春生[1] 东海杰[1] 孟令超[1] 

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《激光与红外》2013年第7期766-770,共5页Laser & Infrared

摘　　要：杜瓦是大面阵红外焦平面探测器组件的重要组成部分,为其提供光学、机械、热学和电学接口,因此对该杜瓦结构的可靠性有较高要求。由于此类产品样本数极少,传统的基于概率模型的可靠性设计方法在理论和应用上均存在较大的问题。有鉴于此,提出了基于区间分析的结构非概率可靠性模型,并将所建模型用于大面阵红外焦平面探测器杜瓦结构的可靠性优化设计。研究结果表明,非概率可靠性设计方法只要求已知设计参数的界限,而不要求其具体的分布形式,所需数据较少,特别适用于小子样大面阵红外焦平面探测器杜瓦的可靠性设计。Dewar is an essential part of the large format IR detector assembly, which provides the necessary hermetic vacuum, the cold operating temperature and the interfaces of optics, electronics, and mechanics. So the Dewar must have high inherent reliability. However, the samples of Dewar for large format IR detector are limited and the tradition- al probabilistic reliability design method is restricted. In this paper, non-probabilistic reliability model is established by utilizing interval variables analysis. Based on this non-probabilistic reliability model, the reliability optimization design method is applied in the structure design of the large format IR detector Dewar. It indicates that this non-probabilistic reliability optimization design does not require a presumed probability distribution of the uncertain parameters and only the bounds or ranges of variation of them are required. So it is a good method when the available design data of uncer- tainties is less.

关 键 词：非概率可靠性 可靠性设计 大面阵红外探测器 杜瓦结构 

分 类 号：TN214[电子电信—物理电子学]