Optical micro-scanning location calibration of thermal microscope imaging system  

作　　者：关丛荣 高美静 金伟其 王吉晖 

机构地区：[1]MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology [2]College of Mechanical and Electrical Engineering, North China University of Technology [3]Department of Information Science and Engineering, Yanshan University

出　　处：《Journal of Beijing Institute of Technology》2013年第2期250-255,共6页北京理工大学学报（英文版）

基　　金：Supported by Beijing Natural Science Foundation(4062029);Ministry of Science and Technology Innovation Foundation for Small and Medium-sized Enterprises (06KW1051);North China University of Technology Dr. Start-up Fund for 2013

摘　　要：A method of micro-scanning location adaptive calibration was proposed, which was real- ized by the digital image micro-displacement estimation. With geometric calculation, this calibration method used the displacement estimation of two thermal microscope images to get the size and direc- tion of each scanning location calibration angle. And each location calibration process was repeated according to the offset given by the system beforehand. The comparison experiments of sequence oversampling reconstruction before and after the micro-scanning location calibration were done. The results showed that the calibration method effectively improved the thermal microscope imaging qual- ity.A method of micro-scanning location adaptive calibration was proposed, which was real- ized by the digital image micro-displacement estimation. With geometric calculation, this calibration method used the displacement estimation of two thermal microscope images to get the size and direc- tion of each scanning location calibration angle. And each location calibration process was repeated according to the offset given by the system beforehand. The comparison experiments of sequence oversampling reconstruction before and after the micro-scanning location calibration were done. The results showed that the calibration method effectively improved the thermal microscope imaging qual- ity.

关 键 词：thermal microscope imaging micro-scanning location calibration oversampling recon- struction 

分 类 号：TH742[机械工程—光学工程]