含有统一接口的微电网系统可靠性建模研究  

Modeling Method for Reliability of Micro-Grid Systems Including a Unified Interface

作　　者：张扬[1,2] 刘刚[1] 高志军[1] 査晓明[2] 

机构地区：[1]许继集团有限公司,河南许昌474000 [2]武汉大学电气工程学院,湖北武汉430072

出　　处：《电源学报》2013年第4期30-36,共7页Journal of Power Supply

基　　金：国家自然科学基金资助项目(51177113);国家重大基础理论研究(973计划)资助项目(2012CB215100)

摘　　要：采用统一接口系统的微电网可靠性问题较为特殊,需要单独建模。结合概率统计思想,将稳定性问题分为软件问题和硬件问题两大类,并提出了平均失效时间和最短失效时间的计算依据,根据电网结构的并联和串联规律进行有效失效时间的计算,进而评估整个微电网系统的可靠性,得出了基于概率统计和网络结构的针对微电网的可靠性建模方法。最终通过IEEE34节点测试系统进行计算,说明了该方法的计算流程。The reliability research of the Micro-Grid including a unified interface needs a separating modeling. Considering the probability of statistical, the stability problem was divided into two major categories of software and hardware issues and made a mean time to failure and the shortest time to failure calculated on the basis of calculation of the effective time to failure according to the grid structure of the parallel and series laws of to assess the reliability of the whole micro-grid system, obtained for micro-grid reliability modeling methods based on probability and statistics, and network structure. Finally, the IEEE34 bus test system was calculated to illustrate that the method of calculation process.

关 键 词：统一接口 微电网系统 平均失效时间 最短失效时间 

分 类 号：TM727[电气工程—电力系统及自动化]