浅表层及粗晶材料缺陷超声诊断方法  

Ultrasonic detection method for shallow and coarse-grained material fault

作　　者：闫晓玲[1,2] 董世运[2] 徐滨士[2] 潘亮[2] 王望龙[2] 

机构地区：[1]北京理工大学机械与车辆学院,北京100081 [2]装甲兵工程学院装备再制造技术国防科技重点实验室,北京100072

出　　处：《中南大学学报（自然科学版）》2013年第7期2751-2755,共5页Journal of Central South University:Science and Technology

基　　金：国家自然科学基金资助项目(50975287);国家重点基础研究发展计划("973"计划)项目(2011CB013405)

摘　　要：针对浅表层及粗晶材料,提出一种用小波变换与广义相关倒频谱分析相结合的缺陷诊断方法。该方法利用小波多分辨特性去除白噪声,利用广义相关倒频谱剔除始脉冲及材料散射噪声。实验结果表明:该方法提高了对浅表层及低信噪比缺陷的分辨力,缺陷诊断结果与实际结果相吻合,可用于浅表层及粗晶材料缺陷的诊断。A new diagnosis method by using wavelet transform and the generalized correlation cepstrum was introduced for shallow and coarse-grained materials.The wavelet for multi-resolution analysis was used to suppress the white noise,and the generalized correlation cepstrum excluded the impact of Initial pulse and material scattered noise.The experimental results show that the resolution of shallow and low SNR faults is improved by the method using wavelet transform and the generalized correlation cepstrum.The fault diagnosis results are consistent with the actual results,so the method can be used for the diagnosis of shallow and low SNR faults.

关 键 词：浅表层 粗晶材料 小波变换 相关倒频谱 缺陷诊断 

分 类 号：TM343[电气工程—电机] TP277[自动化与计算机技术—检测技术与自动化装置]