一种X射线测厚校正方法的研究  

Research of a Correction Method of Thickness Measurement Based on X-ray

作　　者：高富强[1,2] 陈赟飞[1] 安康[2] 周钦[1] 

机构地区：[1]重庆大学自动化学院,重庆400030 [2]重庆大学光电技术及系统教育部重点实验室ICT研究中心,重庆400030

出　　处：《核电子学与探测技术》2013年第5期621-623,646,共4页Nuclear Electronics & Detection Technology

基　　金：中央高校基本科研业务费科研专项(0210005202035)

摘　　要：针对工业CT系统中所使用的X射线是一种多能谱射线,进而导致厚度测量不准确的现象,介绍了X射线测厚原理,分析了X射线在对物体进行厚度测量时发生射束硬化现象对测量结果的影响,推导出一种用于测厚的校正数学模型,并通过CD-300BXR型工业CT研究平台对该数学模型进行了验证。实验结果表明,当被测钢板厚度范围为5～50 mm时,利用该校正模型进行测厚的相对误差在±0.5%以内,能满足实际测厚需求。The X-ray that used in industrial CT is a multi- energy ray, which leads to inaccurate thickness measurement. Considering this, the principle of X - ray thickness measurement and the effect of beam harden- ing phenomenon of X - ray are analyzed in the paper. Then, a mathematical model for correction is derived, and we verify the model through CD - 300 BXR research platform. The experimental results show that, the rel- ative error of thickness measurement based on the proposed model is less than 0.5 % when the measured steel plates range from 5 mm to 50 mm, which can satisfy the actual demand for thickness measurement.

关 键 词：工业CT X射线 测厚 校正模型 实验 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]