智能型并联谐振交直流耐压试验装置的研制  

Development of intelligent parallel resonance AC/DC withstand voltage test device

作　　者：孙冬娥 郭跃安 高华[2] 张莹[1] 冯亚[1] 

机构地区：[1]西北有色地质研究院,陕西西安710054 [2]西安邮电大学管理工程学院,陕西西安710061

出　　处：《现代电子技术》2013年第15期153-156,共4页Modern Electronics Technique

摘　　要：采用并联谐振补偿原理,研制了智能型交直流耐压实验装置,装置保证试验电压的工频频率和波形质量。对被试品的状态参数(电压、电流、频率)进行实时采样,并可根据试验要求对电压波形进行智能分析,打印试验结果及波形,仪器测量精度为0.5%。整套设备从传统试验设备的5～6 t,减轻到现在的50～200 kg,缩短试验时间。An intelligent AC/DC withstand voltage test device was developed on the basis of parallel resonance compensa- tion principle. The device ensures the power frequency and the waveform quality of the test voltage. The real-time sampling of state parameters （voltage, current and frequency） for the specimin under test was performed. The intelligent analysis and test result printing for voltage waveform can be conducted according to the experiment request. The detecting precision of the instru-ment is 0.5%. The weight of the whole device was lightened from 5-6 t to 50-200 kg. The experiment duration was shortened.

关 键 词：并联谐振技术 工频频率 ADI高性能电能计量芯片 ARM系列芯片 

分 类 号：TN06-34[电子电信—物理电子学]