实验室常用集成电路芯片功能验证软件平台的设计  

Design of integrated circuit chip tester

作　　者：杨燕姣[1,2] 李泽明[1,2] 张会新[1,2] Yang Yanjiao;Li Zeming;Zhang Huixin(National Key 1aboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China;Ministeria1 Key Laboratory of Instrumentation Science&Dynamic Measurement,North University of China,Taiyuan 030051,China)

机构地区：[1]中北大学电子测试国家重点实验室,山西太原030051 [2]中北大学仪器科学与动态测试教育部重点实验室,山西太原030051

出　　处：《计算机测量与控制》2013年第8期2271-2273,共3页Computer Measurement &Control

基　　金：国家自然科学基金项目(61076111)

摘　　要：采用VB编写上位机软件,利用FPGA芯片来做硬件控制器,设计出了一种基于FPGA和软件/硬件联动配置技术的集成电路芯片功能验证测试装置,实现对实验室常用集成电路芯片功能好坏测试并作出评估;该装置实现了同一插槽测试不同芯片和集成电路测试台上最多达二个芯片同时测试的功能;该装置已成功地用于包括TTL74138、IDT7206、DS26C31等多个实验室常用集成电路芯片的功能测试。The article develop a kind of tester for integrated circuit chips based on FPGA technique and upper and lower linkage configuration tech-nology,where chip XC2S50 of Spartan--II 25V serial and the Visual Basic language are used.The test of different chips in the same location and multi--chip testing simultaneously on IC tester are realized.This tester had been successfully applied in testing chips of TTL74LS138,IDT7206,DS26C31 such are commonly and widely used in laboratory.It was proved that the tester was featuring cheap and simpleness.

关 键 词：FT245 FPGA VB上位机 功能测试 

分 类 号：TH79[机械工程—仪器科学与技术]