500kV复合绝缘子脆断事故研究与劣化机理分析  被引量:27

Fracture Fault Analysis and Aging Mechanism Study for 500 kV Composite Insulator

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作  者:冉学彬 鲁兹[2] 成立[2] 郭晨鋆[2] 关志成[2] 王黎明[2] 

机构地区:[1]南方电网超高压输电公司天生桥局,贵州562400 [2]清华大学深圳研究生院能源与电工新技术实验室,深圳518055

出  处:《高压电器》2013年第9期35-43,共9页High Voltage Apparatus

摘  要:笔者分析了一起500 kV复合绝缘子脆断事故以及老化机理。该复合绝缘子脆断事故的特征与常见的脆断故障不同,在硅橡胶护套表面出现了部分贯通蚀孔,解剖后可以发现部分区域脱粘且在护套与芯棒交界面有漏电蚀痕。观察到故障复合绝缘子的宏观与微观交界面均存在一定的质量问题。使用傅氏变换红外光谱分析芯棒材料,证明在芯棒材料中存在玻璃化侵蚀,离子交换以及水解等老化过程。最后结合试验结果,分析了此类由于水份侵入而造成的老化现象,并建议在线监测中需关注复合绝缘子交界面质量。In this paper,a fractured 500 kV AC composite insulator,whose fracture characteristics differ from those of brittle fracture, is analyzed in order to identify the aging mechanisms involved and their causes. Several sheath punctures occurred along the insulator which apparently originated from inside the insulator. Removal of the sheath revealed weak adhesion as well as tracking along the sheath-core interface. Weak microscopic as well as macroscopic interfaces were observed. The core material was analyzed by means of FTIR identifying glass corrosion,ion exchange and hydrolysis as major degradation mechanisms. Based on the results of analysis a water induced aging process is proposed and recommendations for online monitoring of composite insulators with respect to interracial aging are given.

关 键 词:外绝缘 复合绝缘子 脆断 老化机理 

分 类 号:TM216[一般工业技术—材料科学与工程]

 

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