玻璃融片制样-X射线荧光分析陶瓷原材料中的氧化物成分  

Analysis on Oxide Composition of Ceramic Raw Materials by Method of XRF Melting Glass Plate

作　　者：崔立明 刘晓毅 张斌 

机构地区：[1]国家陶瓷与耐火材料产品质量监督检验中心,淄博255000

出　　处：《中国陶瓷》2013年第9期69-71,共3页China Ceramics

摘　　要：通过X射线荧光光谱法对玻璃熔片制备的陶瓷材料进行测试,结果表明其中主量元素的误差符合建立常规的仪器分析方法的要求。所建立的标准曲线的线性范围能有效覆盖粘土、长石及高铝质陶瓷材料及制品的含量范围。The results of the test on the prepared ceramic materials on the melting glass plate, by X ray fluorescence spectrometry, show that the deviation of the main elements could accord to the requirements of the conventional instrumental methods. The linear range of the built standard curve could effectively cover the range of the content of clay, feldspar and high alumina ceramic materials and products.

关 键 词：X射线荧光 陶瓷材料 玻璃熔片 

分 类 号：TQ174.66[化学工程—陶瓷工业]