红外测距仪模拟检测电路固有延时测量研究  

Inherent delay measurement of infrared range finders simulating test circuit

作　　者：王伟明 沈晓彦[2] 陈志斌 张超 

机构地区：[1]军械技术研究所,河北石家庄050000 [2]中国兵器工业标准化研究所,北京100089

出　　处：《电子技术应用》2013年第9期41-43,共3页Application of Electronic Technique

摘　　要：介绍了一种采用C8051F320单片机和高精度时间-数字转换器件TDC-GP21设计的测量电路,以C8051F320内部两路电压比较器分别对幅值较小的输入脉冲和输出脉冲电平进行抬升,使其能够触发TDC-GP21的测量通道,实现了TDC-GP21对高速数据转换电路固有延时的高精度测量。A measurement circuit introduced an MCU C8051F320 and a high-precision time-digits converting chip TDC-GP21 is represented. The low level input pulse and output pulse through the data converting circuit can trigger the measurement channel of TDC-GP21 by lifting up respectively via two voltage comparators in the MCU, and then the inherent delay can be measured by TDC- GP21.

关 键 词：红外测距仪 高速数据转换电路 固有延时 TDC—GP21 

分 类 号：TN249[电子电信—物理电子学]