手征媒质的手征参量ξ_c对反射特性的影响  

Influence of Chirality Admittance ξ_c on Reflection Characteristics

作　　者：高成[1] 舒永泽[2] 

机构地区：[1]解放军理工大学工程兵工程学院南京,210007 [2]南京航空航天大学电子工程系南京,210016

出　　处：《南京航空航天大学学报》2000年第5期522-526,共5页Journal of Nanjing University of Aeronautics & Astronautics

基　　金：国家自然科学基金!(编号 :5 90 82 419)资助项目

摘　　要：利用传输线理论 ,分析金属衬底的单层手征介质与自由空间的分界面上电磁波垂直入射时 ,ξc数值的变化对媒质反射特性的影响。计算结果及部分实验结果表明 :在媒质中掺杂手征微结构的浓度增加 ,等效于ξc 的实部与虚部同时变化。分别改变ξc的实部与虚部 ,结果发现 ,手征参数ξc的虚部调整在最佳值时 ,会在某一频率点上取得最小反射率 ;而随着ξc的实部增加 ,最小反射频率减小。由此得出结论 ,在设计手征吸波媒质时 ,可以通过优化设计 ξc的实部、虚部的值 ,来实现在某一波段上较佳的吸波特性。Chirality can be used as a sensitive parameter to control EM wave propagation characteristics in dielectric composites. In this paper, the theory of transmission line is used to analyze the reflection problem of metal backed single layer chiral media slab with normal linear polarized wave incidence. Some numerical results are compared with experimental results. It can be seen that the effect of the increase on volume concentrations of embedded chiral microstructures cause the rising of ξ c and the changing of imaginary part of ξ c . The numerical result show that when the real part of ξ c is increased the minimum reflectance frequency point is move downward and when the imaginary part of ξ c is changed to a proper value the reflectance can be a minimum. The better absorbing property in a frequency band can be achieved by optimizing the value of the real part and imaginary part of ξ c in the design of chiral absorbing media.

关 键 词：反射特性 吸波涂料 吸收介质 手征媒质 手征参数 

分 类 号：TN011[电子电信—物理电子学]