Hilbert谱分析在探地雷达薄层识别中的应用  

Application of Hilbert spectrum analysis in Ground Penetrating Radar thin layer recognition

作　　者：张先武[1,2] 高云泽[1] 方广有[1] 

机构地区：[1]中国科学院电子学研究所,电磁辐射与探测技术中国科学院重点实验室,北京100190 [2]中国科学院大学,北京100049

出　　处：《地球物理学报》2013年第8期2790-2798,共9页Chinese Journal of Geophysics

基　　金：国家重点基础研究发展计划(973计划)项目(2010CB73190105)资助

摘　　要：针对实际勘探中的需要,本文对薄层的电磁波反射特性进行了深入研究.薄层在反射电磁波时,会对入射电磁波进行滤波作用.薄层的类型和厚度会影响其滤波特性,利用此特点,本文将Hilbert谱分析方法引入到薄层识别中.该方法能将探地雷达对递变型薄层的垂直分辨率提升至λ/8.本文利用该方法对实测探地雷达资料进行了层位识别研究,该方法能很好地提高探地雷达的层位识别能力.This paper makes a deep study of thin layer＇s electromagnetic reflection properties in accordance with the need of actual exploration. The thin layer function is a filter for incident electromagnetic wave when the thin layer reflects electromagnetic wave. For thin layerrs type and thickness influence its filtering properties, the paper introduces Hilbert Spectrum Analysis method to recognize the thin layer by exploiting this character. The method can help improve Ground Penetrating Radarrs vertical resolution on the graded thin layer up to ~l/8. This paper employs such method to make a layer recognition study on actual Ground Penetrating Radar data, by which layer recognition ability of Ground Penetrating Radar can be well improved.

关 键 词：探地雷达 薄层识别 Hilbert谱分析 

分 类 号：P631[天文地球—地质矿产勘探]