电负反馈压缩半导体激光器线宽方法的研究  

Study of linewidth reduction for a semiconductor laser by elebtrical negative feedback

作　　者：张军 李振华 林志瑷 

出　　处：《电子器件》1991年第1期38-43,共6页Chinese Journal of Electron Devices

摘　　要：本文详细地讨论了电负反馈压缩半导体激光器线党方法中几个因素,如反馈环路增益、反馈环路特性、探测器噪声、激光器本征IM噪声等对压缩线宽的影响,推导出受这些因素所限的激光器可压至的最小线宽表达式,并据此提出了减小这些因素影响的一种电负反馈压缩线宽的方案.The influence of several factors to the linewidth reduction of the semiconductor laser by electrical negative feedback,such as gain of the photodetector and intrinsic IM noise in the LD,are discussed thoroughly The expressions of minimum attainable linewidth ,limit ed,l inie d by those factors are given respectively .A Setup of linewidth reduction by electrical nagative feedback reducing those influences is proposed.

关 键 词：半导体激光器 电负反馈 线宽 通信 

分 类 号：TN248.4[电子电信—物理电子学]