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机构地区:[1]中国科学院电子学研究所微波成像技术国家级重点实验室,北京100190 [2]中国科学院大学,北京100039
出 处:《电子与信息学报》2013年第9期2141-2146,共6页Journal of Electronics & Information Technology
基 金:国家973计划项目(2009CB724003)资助课题
摘 要:对于重叠区域较小的相邻两条带SAR图像,严重几何畸变使得难以直接提取同名点(Tie Points,TPs)。该文基于InSAR图像成像信息和相干信息提出一种新的同名点提取方法。该方法首先根据成像信息对原始图像进行仿射变换,然后利用光学影像特征匹配的方法获得同名点,最后以相干系数图为导引对同名点进行筛选。通过对实际InSAR数据(重叠区域<15%)的处理,该方法不仅能够自动提取同名点,而且提取的同名点满足高精度的干涉测图要求。同时使得一幅高精度正射图像由5个条带减少到3个条带拼接,大大降低了测图作业量和测图成本。For SAR images of two adjacent strips with the smaller overlapping area, the severe geometric distortion makes it difficult to extract directly the Tie Points (TPs). Based on imaging information and coherent information of the InSAR images, this paper puts forward a new method for extracting TPs. First, it makes the raw image process the affine transformation with the imaging information; and then it uses the feature matching method of optical image to obtain TPs; finally, the TPs are selected according to the quality map. Experiments on the real InSAR data (overlap region 〈15%) demonstrate that it can not only automatically extract TPs, but also the extracted TPs meet the requirements for the interferometric mapping of some scale. At the same time, it makes the number of strips reduce from five to three joining together for an image of some scale, which decrease greatly the mapping work and mapping cost.
关 键 词:InSAR图像 成像信息 同名点 相干系数图 干涉测图
分 类 号:TN959.73[电子电信—信号与信息处理]
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