Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope  

作　　者：YU JianQiang YUAN JingHe ZHANG XueJie LIU JianLi FANG XiaoHong 

机构地区：[1]Beijing National Laboratory for Molecular Sciences,Key Laboratory of Molecular Nanostructure and Nanotechnology,Institute of Chemistry,Chinese Academy of Sciences

出　　处：《Chinese Science Bulletin》2013年第33期4045-4050,共6页

基　　金：supported by the National Basic Research Program of China(2013CB933701);the National Natural Science Foundation of China(91213305,21127901,21121063);Chinese Academy of Sciences

摘　　要：We have built an integrated imaging system by combining stimulated emission depletion(STED)microscope and atomic force microscope(AFM).The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of42 nm was achieved.With this integrated imaging system,morphological features,mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples.This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine.We have built an integrated imaging system by combining stimulated emission depletion （STED） microscope and atomic force microscope （AFM）. The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of 42 nm was achieved. With this integrated imaging system, morphological features, mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples. This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine.

关 键 词：原子力显微镜 成像系统 集成系统 受激发射 纳米级 损耗 光纤激光器 横向分辨率 

分 类 号：TB383.1[一般工业技术—材料科学与工程] TN16[电子电信—物理电子学]