检测半导体激光器性能的虚拟仪器  

Virtual Instrument for Characteristic Detection of Semiconductor Lasers

作　　者：王洋 张永林[1] 

机构地区：[1]暨南大学物理系,广东广州510632

出　　处：《半导体光电》2000年第6期399-401,共3页Semiconductor Optoelectronics

摘　　要：介绍了一种检测半导体激光器光谱特性和P -I特性的仪器系统。系统采用虚拟仪器技术 ,提高了数据采集、处理能力及系统的拓展升级能力 ,增强了半导体激光器的驱动及其控制功能 ,达到了简化系统结构、降低系统成本的目的。对几种半导体激光器进行了实际测试 ,证明本系统使用方便、效率高、结果可靠。A newly developed instrument for detecting spectra and P-I characteristics of semiconductor lasers is presented in this paper.By using the technology of the virtual instrument,the system has improved its ability such as data acquisition,data processing and system upgrading,while the functions of driving and its control for the LD have been enbanced.As a result,the structure of the system is simplified and the cost is reduced.Several types of LDs are tested on the system,which shows that the system is convenient and efficient to use and the detection results are credible.

关 键 词：半导体激光器 光电检测 虚拟仪器 锁相放大器 

分 类 号：TN247[电子电信—物理电子学] TP216[自动化与计算机技术—检测技术与自动化装置]