红外敏感器储存可靠性评估方法研究  

Research on the evaluation method for storage reliability of infrared sensor

作　　者：陈忠振[1] 许路铁[1] 俞卫博[1] 

机构地区：[1]军械工程学院,河北石家庄050003

出　　处：《电子设计工程》2013年第20期53-55,共3页Electronic Design Engineering

摘　　要：结合弹药储存可靠性评估指标,总结了弹药储存可靠性评估的传统方法,提出了以加速寿命试验评估方法作为红外敏感器储存可靠性评估的可行途径。针对加速寿命试验实施的一般流程,分析了对红外敏感器进行加速寿命试验存在的难点并给出了解决办法。为下一步进行以红外敏感器为代表弹载光电系统储存可靠性评估,提供了新思路。Combination of evaluation indexes of ammunition storage reliability, the traditional methods of ammunition storage reliability evaluation were summarized. Accelerated life testing was chosen as a feasible method for infrared sensor storage reliability evaluation. According to the general process of accelerated life testing implemented, the difficulties were analyzed and the solutions were presented. New ideas were provided for evaluation of storage reliability by infrared sensor as the representative of the missile-borne photoelectric system the next step.

关 键 词：储存可靠性 红外敏感器 评估方法 加速寿命试验 

分 类 号：TN45[电子电信—微电子学与固体电子学]