用H/V谱比法与折射微动法确定表土层参数  

Determination of Soil Parameters using H/V Spectral Ratio and Refraction Microtremor Methods

作　　者：张文辉[1,2] 金维浚[1] 张衡[1,2] 

机构地区：[1]中国科学院地质与地球物理研究所,北京100029 [2]中国科学院大学地球科学学院,北京100049

出　　处：《地震》2013年第4期172-181,共10页Earthquake

基　　金：国家自然科学基金重点项目(40830424)资助

摘　　要：表土层参数对地震场地响应有重要影响,通过H/V谱比法和折射微动(REMI)方法确定场地表土层厚度和速度结构等有实际意义。REMI方法采用常规折射地震采集设备,利用自然震动作为源,通过地震波场τ-p变换和傅立叶变换,将地震记录从时空域变换到慢度-频率域提取频散曲线,不同于主动源面波勘探,被动源面波勘探能获得更大深度的土层结构。Soil parameters have an important impact on the response to earthquake damage,H/V spectral ratio and the refraction microtremor （REMI） methods are of practical significance to determine soil thickness and velocity structure of the site.The REMI method acquires data by the conventional refraction seismic equipment,and makes use of ambient seismic field as the source.The transformation from the time-space domain to the slowness-frequency domain will be carried out in the REMI method to extract the dispersion curve by means of the tau-p transform and the Fourier transform.Different from surface wave exploration of active source,the soil structure will be achieved in the greater depth by the dispersion curves inversion.

关 键 词：表土层参数 H V谱比法 折射微动(REMI)法 面波反演 

分 类 号：P315[天文地球—地震学]