瓷质显微结构对盘形悬式瓷绝缘子性能的影响  

Influence of Ceramic Microstructure on Property of Ceramic Cap and Pin Insulator

作　　者：丁京玲[1] 尹宗举 姚军[1] 谢玉敏 

机构地区：[1]西安高压电器研究院有限责任公司,西安710077 [2]贵州九天高原电瓷有限公司,贵州毕节710247

出　　处：《电瓷避雷器》2013年第5期13-18,共6页Insulators and Surge Arresters

摘　　要：通过对盘形悬式瓷绝缘子瓷质显微结构的试验和X光衍射试验,从物相的种类、分布、大小、数量以及各物相之间的关系进行了研究和定量分析;从原料质量、坯料颗粒细度、坯件烧成、各物相含量控制等制造工艺,提出了提高盘形悬式瓷绝缘子机电性能的改进措施,为研制500kV以上超或特高压、高强度绝缘子奠定了基础。Abstract： The type, distribution, size, number of phase and relationship between different phases were studied and quantitative analyzed through the ceramic microstructure experiment and X-ray diffraction test on ceramic cap and pin insulator; improvement measures about improving the electromechanical properties of ceramic cap and pin insulator were advised in material quality, grain fineness of blank and manufacturing process such as blank firing and quality control of different phases. This study laid the foundation for the development of EHV and UHV above 500kV high strength insulator.

关 键 词：盘形悬式瓷绝缘子 电瓷材料 显微结构 物相 制造工艺 

分 类 号：TM216[一般工业技术—材料科学与工程]