缺陷层的材料吸收对远红外窄带滤光片的调制研究  

Influence of Defect Layer Absorption on Narrow Band Far Infrared Filter

作　　者：王超[1,2] 时家明 赵大鹏[1] 汪家春[1] 陈宗胜[1] 袁忠才[1] 许波[1] 林志丹[1] 程立[1] 党可征[1] 

机构地区：[1]电子工程学院脉冲功率激光技术国家重点实验室 [2]63811部队

出　　处：《真空科学与技术学报》2013年第10期1057-1060,共4页Chinese Journal of Vacuum Science and Technology

基　　金：红外与低温等离子体安徽省重点实验室主任基金项目(2010A001002D)

摘　　要：利用薄膜光学中的特征矩阵法，研究了缺陷层介质存在吸收（折射率含有虚部）时，远红外窄带滤光片随不同吸收系数的变化。结果表明，当n=2．2-0i变为2．2-0．03i时，滤光片始终有两个全向带隙的存在，带隙宽度和带隙率均逐渐减小（n=2．2-0i时，两个全向带隙宽度和带隙率分别为8．23～8．88μm，10．04-11．26μm，7．60％和11．46％；n=2．2—0．03i时，两个全向带隙宽度和带隙率分别为8．28～8．50μm，10．15～11．16μm，2．62％和9．48％）。当n=2．2—0．05i和2．2—0．1i时，滤光片都只存在一个全向带隙，带隙宽度和带隙率也同样逐渐减小（n=2．2—0．5i时，全向带隙宽度和带隙率分别为10．18～11．08μm和8．47％；n=2．2—0．1i时，全向带隙宽度和带隙率分别为10．47—10．72μm和2．36％）。当n=2．2—0．3i时，滤光片的全向带隙都消失了。同时，滤光片缺陷处的反射率逐渐增大，透射率和吸收率（含有吸收时）一直在减小直至接近0。本文的研究对远红外窄带滤光片的设计和实际应用提供了有价值的参考。The influence of the absorption of the defect layer, the imaginary part of the refractive index （n）, on the properties of the thin-film infrared filter with a narrow-band pass was evaluated by means of the characteristic matrix method. The calculated results show that the absorption of the defect layer significantly affects the properties of the filter, such as the number of the omni-direcfional band gap, its band width, and its band gap rate. For example, as n = 2.2 - 0i changed into n = 2.2- 0.03i, two omni-direcfional band gaps were observed with decreasing band width and band gap rate. When n = 2.2- 0.05i and n = 2.2- 0.1i, only one omni-directional gap was observed with reduced band width and band gap rate. When n = 2.2 - 0.3i, the omni-directional gap vanished. As the reflectance of the defect layer increased,both the transmittance and absorptance （if any） slowly decreased to zero.

关 键 词：吸收 窄带滤光片 全向带隙 反射率 透射率 

分 类 号：O434[机械工程—光学工程]