一种集成电路测试用程控信号源的设计  

Design of IC Testing Program Controlled Signal Generator

作　　者：王鑫[1] 李力军[1] 

机构地区：[1]北京自动测试技术研究所,100088

出　　处：《电子测试》2013年第10期12-15,共4页Electronic Test

摘　　要：针对目前集成电路测试系统中交流参数的测试现状,提出一种基于PCI总线和直接数字频率合成技术(Direct Digital Synthesize,DDS)的程控信号源设计方案;文章先介绍了整个信号源系统的构成与工作原理,随后详细论述DDS信号发生模块、幅度调节模块等模块的硬件设计;目前该信号源已通过相关部门验收并交付使用,该信号源可满足各种测试环境要求,同时其技术指标也达到了预期设计的精度要求。To the present conditions of AC parameters for IC test system, this paper puts forward a design method based on PCI bus and the technology of the direct digital synthesis. The paper first describes the structure and function principle of the total system, and stress on the hardware circuit design of the programmed control module and amplitude adjustment module of the system. At present, this signal sources has been identified by the related institute and used formally, it can satisfy the different environment of the test. The technical targets are totally accord with the requirements of the expected design accuracy.

关 键 词：DDS 信号源(signal generator) 自动测试系统(automatic testing system) 集成电路测试(IC test) 

分 类 号：TN407[电子电信—微电子学与固体电子学]