基于线性透镜阵列的面结构光三维测量方法  

Structured light 3D measurement method based on linear lens array

作　　者：赵灿[1] 陈秀[1] 

机构地区：[1]黑龙江科技大学现代制造工程中心,哈尔滨150022

出　　处：《黑龙江科技学院学报》2013年第5期459-462,共4页Journal of Heilongjiang Institute of Science and Technology

基　　金：国家自然科学基金面上项目(51075128);国家科技重大专项项目(2010ZX04016-012)

摘　　要：面结构光测量无法处理类镜面物体由反光产生的强光区域,且无法提取物体在阴影区域里的有效信息,造成测量噪声大和测量数据不完整。基于正弦光栅的面结构光测量方法,提出一种基于线性透镜阵列的面结构光三维测量方法,通过在测量设备和被测量物体间加装线性透镜阵列,使得正弦光栅在竖直方向把一维的光线转化为一个二维反射光的光域,有效地解决了结构光在测量过程中存在的反光及阴影问题。经过理论分析与实验验证,该方法切实可行。Aimed at an answer to the surface structured light measurement method incapable of coping with the specular object produced by the reflective area and recovering effective information on objects in the shaded area,thus producing a greater measurement noise and incomplete measurement data,this paper,drawing on surface structured light measurement method of the sinusoidal illumination patterns,proposes a linear lens array-based structured light 3 D measurement method.The method affords an effective solution to the presence of specularities and shadow negatively affecting structured light measurement process,by installing a linear lens array between the measuring device and measured object and turning the sinusoidal illumination patterns in the vertical direction from one-dimensional light into two-dimensional reflected light field.The theoretical analysis and experimental verification show feasibility of the method.

关 键 词：透镜阵列 面结构光 反光 阴影 

分 类 号：TH741[机械工程—光学工程]