Towards quantum-enhanced precision measurements:Promise and challenges  

作　　者：张利剑 肖敏 

机构地区：[1]College of Engineering and Applied Sciences, Nanjing University [2]Department of Physics, University of Arkansas, Fayetteville

出　　处：《Chinese Physics B》2013年第11期46-51,共6页中国物理B（英文版）

基　　金：Project supported by the National Basic Research Program of China(Grant Nos.2012CB921804 and 2011CBA00205)

摘　　要：Quantum metrology holds the promise of improving the measurement precision beyond the limit of classical ap- proaches. To achieve such enhancement in performance requires the development of quantum estimation theories as well as novel experimental techniques. In this article, we provide a brief review of some recent results in the field of quantum metrology. We emphasize that the unambiguous demonstration of the quantum-enhanced precision needs a careful analysis of the resources involved. In particular, the implementation of quantum metrology in practice requires us to take into ac- count the experimental imperfections included, for example, particle loss and dephasing noise. For a detailed introduction to the experimental demonstrations of quantum metrology, we refer the reader to another article ＇Quantum metrology＇ in the same issue.Quantum metrology holds the promise of improving the measurement precision beyond the limit of classical ap- proaches. To achieve such enhancement in performance requires the development of quantum estimation theories as well as novel experimental techniques. In this article, we provide a brief review of some recent results in the field of quantum metrology. We emphasize that the unambiguous demonstration of the quantum-enhanced precision needs a careful analysis of the resources involved. In particular, the implementation of quantum metrology in practice requires us to take into ac- count the experimental imperfections included, for example, particle loss and dephasing noise. For a detailed introduction to the experimental demonstrations of quantum metrology, we refer the reader to another article ＇Quantum metrology＇ in the same issue.

关 键 词：quantum metrology quantum information processing 

分 类 号：O413[理学—理论物理] TH811[理学—物理]