一种用于CMOS图像传感器集成ADC的性能测试系统  

Performance test system for ADC of CMOS image sensor

作　　者：徐星[1] 陈世军[1] 

机构地区：[1]中国科学院红外成像材料与器件重点实验室中国科学院上海技术物理研究所,上海200083

出　　处：《电子设计工程》2013年第22期191-193,共3页Electronic Design Engineering

摘　　要：在CMOS图像传感器中,A/D起着"承上启下"的作用,承接前端传来的信号,转换成数字后输出,其性能指标直接影响着整个系统的优劣。随着ADC速度和精度的提高,如何高效、准确地测试其动态和静态参数是ADC测试研究的重点。文中阐述了ADC的参数及其测试的原理和方法,并基于Labview软件和数据采集卡构建了ADC的软硬件测试平台,实现了低成本、高可靠性的高精度ADC计算机辅助测试系统。In CMOS image sensor, A/D is a connecting link between the preceding and the following, it receives the signals from the front end and convert to digital outputs, its performance influences the whole system directly. With improved speed and precision of ADCs, how to test the dynamic and static performance becomes critical to ADC test research. This paper describes the parameters of ADC and principles and methods of the test, ADC automatic test system based on the Labview and data acquisition card is presented in order to achieve a low cost high reliability computer-aided test system.

关 键 词：ADC 直方图 FFT LABVIEW 测试 

分 类 号：TN792[电子电信—电路与系统]