透射电子显微镜原位磁场双倾样品杆的研制  

Fabrication of the in situ double-tilt TEM holder with magnetic field

作　　者：杨新安[1] 姚湲[1] 田焕芳[1] 段晓峰[1] 

机构地区：[1]中国科学院物理研究所北京凝聚态物理国家实验室,北京100190

出　　处：《电子显微学报》2013年第5期416-419,共4页Journal of Chinese Electron Microscopy Society

基　　金：中国科学院仪器设备功能开发技术创新项目(No.YG2010010)

摘　　要：本文简述了透射电镜磁场双倾样品杆的设计方案,展示了Philips/FEI透射电镜磁场双倾样品杆的研制成果。利用该样品杆可以产生100 Oe的连续磁场,也可以产生140 Oe以上的瞬间磁场。通过"U"型磁组件和样品杯的巧妙设计,尽可能的减小了电子束在横向磁场中的偏移量。The design of double-tilt TEM holder with magnetic field is described in this paper.A special U shape magnetic coil is fixed on the tip of the hold and the strength of the magnetic field can be adjusted by the external current.The sample cup is truncated to ensure that the sample faces the magnetic field.The U shape coil can applies equal but direction-counter Lorentz force on the electron beam to limit the beam shift and avoid the image distortion.The in-plane stable magnetic field can be kept as 100 Oe and instantaneous strength can reach 140 Oe.

关 键 词：透射电子显微镜 样品杆 原位技术 磁性 

分 类 号：TB43[一般工业技术]