基本参数法X射线荧光分析土壤样品中主量元素  

Determination of Major Elements in Soils Using Fundamental Parameters by X-ray Fluorescence Spectrometry (XRF)

作　　者：任红星[1] 贺春福 张启超[1] 

机构地区：[1]中科院长春应用化学研究所,长春130022

出　　处：《分析试验室》1991年第6期44-46,共3页Chinese Journal of Analysis Laboratory

摘　　要：本文将基本参数法应用于土壤样品的主量元素Al、Si、Fe、Ti、Ca、Mg、Na、K的X射线荧光分析中的数据处理上。粉末压片法制样,标准样品选用地矿部水系沉积物标准参考样。实验结果令人满意。The paper describes the application of the fundamental parameter method in the determination of major elements such as Al, Si, Fe, Ti, Ca, Mg, Na, K in soils by XRF. Powdered sample is pressed directly into a briquette. The reference of standards of the Ministry of Geology and Mineral Resources are used for analytical calibration. Satisfactory results were obtained.

关 键 词：土壤 基本参数法 荧光光谱 X射线 

分 类 号：S153.61[农业科学—土壤学]