X射线荧光光谱法测定工业硅样品中Fe的不确定度评定  

Uncertainty Evaluation for Assay of Fe in Industrial Silicon Sample by X-Ray Fluorescent Spectrometry

作　　者：顾松[1,2] 杨海岸[1,2] 刘英波[1,2] 罗舜[1,2] 

机构地区：[1]昆明冶金研究院,云南昆明650031 [2]国家有色金属产品质量监督检验中心(昆明),云南昆明650031

出　　处：《云南冶金》2013年第5期101-105,共5页Yunnan Metallurgy

摘　　要：分析了运用X射线荧光光谱法测定工业硅中Fe含量时,可能对分析结果产生不确定度的各种原因。依次对分析重复性、标准物质、分析曲线回归、天平称量等方面引起的不确定度分量作出了评定,最后计算了合成标准不确定度以及扩展不确定度,并给出使用该方法检测工业硅中Fe含量所得分析结果的不确定度评定报告。从评定结果得出结论,拟合分析曲线的过程所引入的不确定度对整体影响是最大的。All kinds of reasons for the uncertainty caused in the determination of Fe content in industrial silicon by X-ray.fluo-rescent spectrometry are analyzed in this paper. The following items which can cause uncertainty are evaluated in turn： analysis repeatabili- ty, standard reference material, analysis curve regression, weighing, and the synthetic standard uncertainty and expanded uncertainty are fi-nally calculated, and the uncertainty evaluation report of the Fe content determination analysis result for industrial silicon by this methods is also supplied in this paper. The conclusion from the evaluation result is that the uncertainty caused by the process of analysis curve fitting has the areatest impact to the entiretv.

关 键 词：X射线荧光光谱法 工业硅 不确定度 

分 类 号：O657.34[理学—分析化学]