基于硬件行为的TD-LTE关键技术仿真方案  

A Simulation Scheme for TD-LTE Key Technology Based on Hardware Behavior

作　　者：梁学俊 杨夏喜 吴伟民[2] 吴震 

机构地区：[1]国家信息网络产品质量监督检验中心,江苏苏州215104 [2]华中科技大学电子信息与工程系,湖北武汉430074

出　　处：《微电子学与计算机》2013年第11期72-75,共4页Microelectronics & Computer

摘　　要：提出一种基于硬件行为的TD-LTE关键技术仿真方案,为算法设计和硬件实现之间建立起衔接.该方案采用时间驱动,实现定点仿真功能,即可为产品研发提供可靠的参考数据,也可准确评估产品的最终性能,从而保障了仿真结果和产品性能的一致性.To establish a convergence between algorithm design and hardware implementation ,this paper studies a simulation scheme for TD-LTE key technology based on hardware behavior .By means of time-driving and fixed-point simulating ,this scheme can not only provide reliable reference data for product design ,but also give accurate assessment to the properties of final product .Based on the advantages ,the scheme could ensure the simulation results being in accordance with the performance of final product .

关 键 词：硬件行为 时分长期演进 波束成形 

分 类 号：TN914[电子电信—通信与信息系统]