基于EDA的电子产品一体化设计分析技术  被引量:1

Circuit Integrated Design of Performance and Reliability Based on EDA

在线阅读下载全文

作  者:孙宇锋[1] 赵广燕[1] 

机构地区:[1]北京航空航天大学可靠性与系统工程学院,北京100191

出  处:《中国电子科学研究院学报》2013年第5期453-459,共7页Journal of China Academy of Electronics and Information Technology

摘  要:以故障仿真分析为核心的可靠性与性能一体化设计分析技术,是一项电子产品研制阶段及时发现设计缺陷并有效提升产品固有可靠性的重要技术。简要回顾了相关技术的发展,分析了高可靠电子产品对该技术的需求,阐述了应用电子设计自动化(EDA)工具实现电路性能和可靠性的一体化设计的技术流程,给出了以故障仿真分析为核心实现电路一体化设计的思路。最后着重介绍了建立电路可靠性与性能一体化设计与仿真分析环境时面临的故障建模、故障注入、故障判别、数据接口、仿真效率等关键技术的解决方法,为该技术实现工程实用性提供了重要支持。The integrated design technique of performance and reliability based on fault simulation is a new developing technique to find the design' s weakness and effectively improve product reliability inher- ent during product development. After a brief historical retrospect of the development, the technical re- quirements of high reliability electronic products is analyzed, the implementation process of achieving cir- cuits' integrated designed of performance and reliability by EDA tools is discussed, and the realization of ideas based on fault simulation analysis is presented. The realization methods such as failure modeling, virtual failure rejection, simulator integration, failure automatic criterion and simulation efficiency are fo- cused, which will be significant for engineering practicability when establishing circuit simulation tools for integrated design and analysis of performance and reliability.

关 键 词:故障仿真 性能与可靠性一体化设计 电子设计自动化 

分 类 号:TP202[自动化与计算机技术—检测技术与自动化装置]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象