HPGe-γ谱仪系统的死时间校正  

Experimental Study on the Dead-time Correction for HPGe-γ Spectrometer System

作　　者：王强[1] 方开洪[1] 周钰珊 周小娇[1] 

机构地区：[1]兰州大学核科学与技术学院,兰州730000

出　　处：《核电子学与探测技术》2013年第9期1119-1122,共4页Nuclear Electronics & Detection Technology

基　　金：自然科学基金(11075067);兰州大学中央高校基本科研业务费专项资金资助(860736)

摘　　要：讨论了HPGe-γ能谱仪死时间产生的原因、表示方法,以及对HPGe-γ谱仪系统死时间的校正方法。采用强源干扰法找到了HPGe-γ谱仪系统百分死时间与计数率丢失修正因子的关系,给出了HPGe-γ谱仪系统死时间修正因子的计算公式。得到:应用实际测得的修正因子来反推百分死时间,发现系统标定的百分死时间与实际测得的百分死时间符合较好,验证了系统标定死时间的正确性;扩展了γ谱仪对大计数率的测量范围,将百分死时间扩大至25%;修正因子随系统百分死时间的变化率不随粒子能量变化,可以在全能量范围内应用同一修正公式对测得的γ射线的计数率进行修正。The dead time for HPGe -γspectrometer system was discussed as well as the correction method of the dead-time.A practical method of dead -time correction was given .The relation between the percent dead-time and the correction of counting rate losses for HPGe -γspectrometer system was found by a strong γ-source.The results were given：（1） system calibration of the percent dead -time are not exact, it is different from the measurement value .（2） The measurement range is extended to that the percent dead -time is about 25%.（3） The slope of correction factor with the percent dead -time does not vary with the particle energy , therefore the same correction formula can be applied for full energy range .

关 键 词：HPGe-γ能谱仪 死时间 修正因子 

分 类 号：TL817.2[核科学技术—核技术及应用]