HgCdTe轴温探测器噪声的温度特性研究  

Study on temperature characteristic of noise of HgCdTe shaft temperature detector

作　　者：叶柏松[1,2] 刘飞[1,2] 袁永刚[1] 李向阳[1] 

机构地区：[1]中国科学院上海技术物理研究所红外成像与器件重点实验室,上海200083 [2]中国科学院研究生院,北京100039

出　　处：《传感器与微系统》2013年第12期49-51,54,共4页Transducer and Microsystem Technologies

基　　金：国家自然科学基金资助项目(61204134;61106097);中国科学院院地合作项目(BE2010056);江苏省产学研联合创新资金资助项目(SBY201120177)

摘　　要：针对HgCdTe列车轴温探测器，通过测量不同温度下其噪声功率谱的变化，研究了温度对器件噪声的影响。实验结果表明：在-30-20℃范围内，当温度降低时，探测器噪声显著增加，最大增幅分别达到2．7倍（偏流为1mA时）和3．6倍（偏流为2mA时）。经过理论分析发现，探测器热噪声对总噪声的贡献很小，温度变化的主要影响是器件的产生一复合噪声和1／f噪声。The influence of the temperature on the noise for the HgCdTe shaft temperature detector is studied by measuring variation of noise power spectrum at different temperature. The experimental result shows that the noise markedly increases when the temperature decreases in -30-20℃, and it respectively rises by 2.7 times and 3.6 times when the bias current is 1 mA and 2 mA. It is found that the contribution of the thermal noise is only a small part of the total noise, and the change of temperature mainly affects the generation-recombination noise and 1/f noise of the detector.

关 键 词：HGCDTE 光导探测器 温度 噪声 

分 类 号：TN215[电子电信—物理电子学]